Magnetic-circular-dichroism microspectroscopy at the spin reorientation transition in Ni(001) films
Magnetic-circular-dichroism microspectroscopy at the spin reorientation transition in Ni(001) films
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Ni(001) 薄膜中自旋重定向跃迁的磁圆二色性显微光谱
DOI：
10.1103/physrevb.62.3824
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发表时间：
2000
影响因子：
3.7
通讯作者：
J. Kirschner
中科院分区：
文献类型：
--
作者：
W. Kuch;J. Gilles;Ss Kang;S. Imada;S. Suga;J. Kirschner
用光电子显微镜和x射线磁圆二色谱相结合的方法研究了面心立方Co/Ni/Cu(001)外延超薄膜的自旋重取向转变随Co和Ni膜厚度的变化。这种显微光谱技术使人们能够在亚微米尺度上提取有关镍磁性的局部定量信息。1.4char212.6原子单层(ML)Co和11char214MLNi厚度范围内的磁畴图像表明，自旋重定向是Co和Ni厚度的函数.增加Co厚度或减小Ni厚度会导致磁易轴从$[001]$面外方向切换到$<110>$面内方向。观察到了与体磁矩相似的恒定的有效Ni自旋矩。对于面外磁化强度$(0.080\ifmmodepm\Else\TextPmFI)0.005)和面内磁化强度$(0.053\ifmmodepm\Else\TextPmFI 0.005)，Ni轨道与自旋矩之比表现出明显不同的值，并从与Ni磁晶各向异性的关系进行了讨论。垂直磁化强度的磁化强度向自旋重取向转变线方向增大。
The spin reorientation transition in fcc Co/Ni/Cu(001) epitaxial ultrathin films as a function of Co and Ni film thickness is studied by the combination of photoelectron emission microscopy and x-ray magnetic-circular-dichroism spectroscopy at the Ni ${L}_{2,3}$ edge. This microspectroscopic technique allows one to extract local quantitative information about the Ni magnetic properties on a submicrometer scale. Domain images in the thickness range of 1.4\char21{}2.6 atomic monolayers (ML) Co and 11\char21{}14 ML Ni show that the spin reorientation occurs as a function of both Co and Ni thicknesses. Increasing the Co thickness or decreasing the Ni thickness leads to a switching of the magnetic easy axis from $[001]$ out-of-plane to $〈110〉$ in-plane directions. A constant effective Ni spin moment similar to the bulk magnetic moment is observed. The Ni orbital to spin moment ratio shows distinctly different values for out-of-plane magnetization $(0.080\ifmmode\pm\else\textpm\fi{}0.005)$ and in-plane magnetization $(0.053\ifmmode\pm\else\textpm\fi{}0.005).$ This is discussed in terms of the connection to the Ni magnetocrystalline anisotropy. The domain density of the perpendicular magnetization increases towards the spin reorientation transition line.