Cryogenic PEEM at the Advanced Light Source
Cryogenic PEEM at the Advanced Light Source
复制标题
DOI:
10.1016/j.elspec.2012.05.005
复制
发表时间:
2012-10-01
影响因子:
1.9
通讯作者:
Scholl, Andreas
中科院分区:
文献类型:
--
作者:
Doran, Andrew;Church, Matthew;Scholl, Andreas
X-ray PEEM at liquid helium temperatures at a 3rd generation synchrotron is discussed. Detailed instrument design and performance is presented along with examples of the scientific opportunities afforded through routine low temperature performance with negligible tradeoffs of imaging performance or general ease of use. (C) 2012 Elsevier B.V. All rights reserved.