Investigating Item Bias in a CS1 Exam with Differential Item Functioning
Investigating Item Bias in a CS1 Exam with Differential Item Functioning
复制标题
使用差异项目功能研究 CS1 考试中的项目偏差
DOI:
10.1145/3408877.3432397
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发表时间:
2021
期刊:
影响因子:
--
通讯作者:
Li, Min
中科院分区:
文献类型:
--
作者:
Davidson, Matt J.;Wortzman, Brett;Ko, Amy J.;Li, Min
Reliable and valid exams are a crucial part of both sound research design and trustworthy assessment of student knowledge. Assessing and addressing item bias is a crucial step in building a validity argument for any assessment instrument. Despite calls for valid assessment tools in CS, item bias is rarely investigated. What kinds of item bias might appear in conventional CS1 exams? To investigate this, we examined responses to a final exam in a large CS1 course. We used differential item functioning (DIF) methods and specifically investigated bias related to binary gender and year of study. Although not a published assessment instrument, the exam had a similar format to many exams in higher education and research: students are asked to trace code and write programs, using paper and pencil. One item with significant DIF was detected on the exam, though the magnitude was negligible. This case study shows how to detect DIF items so that future researchers and practitioners can do these analyses.
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DOI:
10.1080/15366367.2019.1610343
发表时间:
2019-10
期刊:
Measurement: Interdisciplinary Research and Perspectives
影响因子:
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作者:
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通讯作者:
R. Gagnon
DOI:
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发表时间:
2008-12
期刊:
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影响因子:
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DOI:
10.1145/3287324.3287370
发表时间:
2019
期刊:
ACM Technical Symposium on Computer Science Education
影响因子:
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DOI:
10.1145/3364510.3364525
发表时间:
2019
期刊:
ACM Koli Calling International Conference on Computing Education
影响因子:
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作者:
Nelson, Greg L.;Hu, Andrew;Xie, Benjamin;Ko, Amy J.
通讯作者:
Ko, Amy J.