Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique

Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique
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DOI:
10.1016/j.microrel.2015.12.011
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发表时间:
2016-02
期刊:
Microelectron. Reliab.
影响因子:
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通讯作者:
A. Salman;F. Farbiz;A. Concannon;H. Edwards;G. Boselli
A. Salman;F. Farbiz;A. Concannon;H. Edwards;G. Boselli
中科院分区:
其他
文献类型:
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作者:
A. Salman;F. Farbiz;A. Concannon;H. Edwards;G. Boselli

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