X-Ray Optics for Observing Dark-Field and Bright-Field Refraction-Contrast Images
X-Ray Optics for Observing Dark-Field and Bright-Field Refraction-Contrast Images
复制标题
用于观察暗场和明场折射对比图像的 X 射线光学器件
DOI：
10.1143/jjap.41.l595
复制
发表时间：
2002
影响因子：
1.5
通讯作者：
M. Ando
中科院分区：
文献类型：
--
作者：
K. Hirano;A. Maksimenko;H. Sugiyama;M. Ando
提出了一种新的X射线光学系统，用于观察暗场和明场折射衬度像。该光学系统由一个准直器和一个分析器组成，它们之间有一个样品。由样品产生的相位梯度由分析仪分辨，透射的X射线记录在X射线胶片上。当检偏器在其选择性反射区域内以一定角度调谐时，观察到清晰的暗场图像。另一方面，当分析器被调谐在选择性反射区域附近但在选择性反射区域外部时，观察到亮场图像。该光学器件在光子工厂的BL-14 B垂直摇摆器光束线上进行了测试。在摇摆曲线中的各个点处拍摄分析仪图像。暗场和亮场图像都被成功地观察到。
A new X-ray optics for observing dark-field and bright-field refraction-contrast images is proposed. The optics consists of a collimator and an analyzer in the Bragg geometry with a sample between them. Phase gradients produced by the sample are resolved by the analyzer and the transmitted X-rays are recorded on an X-ray film. When the analyzer is tuned at an angle inside its selective reflection region, clear dark-field images are observed. On the other hand, when the analyzer is tuned in the vicinity of, but outside, the selective reflection region, bright-field images are observed. This optics was tested at a vertical wiggler beamline, BL-14B, at the Photon Factory. The analyzer images were taken at various points in the rocking curve. Both dark-field and bright-field images were successfully observed.