Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected results
Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected results
复制标题
扩展 X 射线吸收精细结构技术。
DOI：
10.1103/physrevb.11.4825
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发表时间：
1975
影响因子：
3.7
通讯作者：
E. Stern
中科院分区：
文献类型：
--
作者：
F. Lytle;D. Sayers;E. Stern
本文介绍了一种用常规水平X射线衍射仪获得扩展X射线吸收精细结构（EXAFS）的方法。讨论了单色晶体的制备、光谱仪的校准、计数技术、能量标度的评价和数据归一化技术。EXAFS光谱从各种各样的材料，然后显示的变化的影响和各种参数之间的相互作用的理论。最后一节说明了一个简单的图形方案，以获得第一个邻居距离EXAFS数据。
A technique is presented for obtaining extended x-ray-absorption fine structure (EXAFS) using a conventional, horizontal, x-ray diffractometer. Preparation of monochromator crystals, spectrometer alignment, counting techniques, evaluation of the energy scale and data normalization techniques are discussed. EXAFS spectra from a wide variety of materials are then presented to show the variability of the effect and interplay between various parameters of the theory. A final section illustrates a simple graphical scheme to obtain a first-neighbor distance from EXAFS data.