Boundary Observation and Contrast Tuning of Ni/YSZ Anode by TEM and FIB-SEM
Boundary Observation and Contrast Tuning of Ni/YSZ Anode by TEM and FIB-SEM
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通过 TEM 和 FIB-SEM 进行 Ni/YSZ 阳极的边界观察和对比度调整
DOI：
10.1149/06801.1275ecst
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
M. Koyama
中科院分区：
文献类型：
--
作者：
S. Liu;S. Matsumura;M. Koyama
对Ni/YSZ阳极的微观结构进行了研究。用原子分辨透射电子显微镜和高分辨聚焦离子束扫描电子显微镜（FIB SEM）分别研究了界面的原子结构和相衬。获得了Ni/YSZ界面和Ni/YSZ/孔三相界面的图像。在FIB扫描电镜中观察到Ni、YSZ和树脂之间存在明显的相衬。
Ni/yttria stabilized zirconia (Ni/YSZ) anode was investigated in the aspect of microstructure. Atomic resolution transmission electron microscopy and high resolution focused ion beamscanning electron microscopy (FIB-SEM) were used to study the atomic structure of boundaries and phase contrast, respectively. Images of Ni/YSZ interface and Ni/YSZ/pore triple-phase boundary were obtained. High-Index contact surfaces were found. Distinct phase contrast among Ni, YSZ and resin was observed during the slice and view process in FIB-SEM.