Random conical tilt reconstruction without particle picking in cryo-electron microscopy

Random conical tilt reconstruction without particle picking in cryo-electron microscopy
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DOI:
10.1107/s2053273322005071
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发表时间:
2022-07-01
影响因子:
1.8
通讯作者:
Singer, Amit
Singer, Amit
中科院分区:
材料科学3区
文献类型:
--
作者:
Lan, Ti-Yen;Boumal, Nicolas;Singer, Amit

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提出了一种方法,可以根据冷冻电子显微镜中随机圆锥倾斜方案中仅以一个样品倾斜角度收集的显微照片来重建 3D 分子结构。该方法使用显微照片上的自相关分析来估计在某些干扰参数(例如显微照片中分子投影的位置)下不变的分子特征。这使得分子结构可以直接从显微照片重建,完全避免了粒子拾取的需要。用模拟数据演示了重建,并研究了缺失锥体区域的影响。这些结果表明有望降低冷冻电子显微镜中单粒子重建的尺寸限制。
A method is proposed to reconstruct the 3D molecular structure from micrographs collected at just one sample tilt angle in the random conical tilt scheme in cryo-electron microscopy. The method uses autocorrelation analysis on the micrographs to estimate features of the molecule which are invariant under certain nuisance parameters such as the positions of molecular projections in the micrographs. This enables the molecular structure to be reconstructed directly from micrographs, completely circumventing the need for particle picking. Reconstructions are demonstrated with simulated data and the effect of the missing-cone region is investigated. These results show promise to reduce the size limit for single-particle reconstruction in cryo-electron microscopy.