Microstructural development inside the stress induced martensite variant in a Ti-Ni-Nb shape memory alloy
Microstructural development inside the stress induced martensite variant in a Ti-Ni-Nb shape memory alloy
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DOI：
10.1016/s1359-6454(99)00391-2
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发表时间：
2000-04
期刊：
影响因子：
9.4
通讯作者：
Yufeng Zheng;W. Cai;Jin-qiu Zhang;L. C. Zhao;H. Ye
中科院分区：
文献类型：
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作者：
Yufeng Zheng;W. Cai;Jin-qiu Zhang;L. C. Zhao;H. Ye
用电子显微镜观察了Ti-Ni-Nb合金在不同变形程度下应力诱发马氏体（SIM）变体内部的组织演变。SIM与母相的取向关系为：[11 <$0]M//[111 <$]B，（001）M5°远离（101）B2。在轻微变形阶段，SIM变体的晶格不变量切变主要为（11 1 <$）I型孪晶。除了普通的滑移外，随着变形的进一步进行，形变变体内部二次孪晶由（111）Ⅰ型孪晶向（011）Ⅱ型孪晶或（011）Ⅰ型孪晶、（001）复合孪晶和（111）Ⅰ型孪晶的调整和发展是同时发生或同时发生的。相应的变形机制包括应力诱导的最有利取向的孪晶系统的SIM子结构带的重取向，应力诱导的SIM子结构边界通过内部孪晶和应力诱导的外来SIM变体注入到预先存在的子结构带的迁移。
The microstructural development inside the stress induced martensite (SIM) variants in Ti–Ni–Nb alloy with various degrees of deformation have been revealed by electron microscopic observations. The orientation relationship between the SIM and the parent phase has been found: [1 1 ̄ 0]M//[11 1 ̄ ]B 2, (001)M5° away from (101)B2. The lattice invariant shear of the SIM variants at the slightly deformed stage is dominantly (11 1 ̄ ) Type I twin. Besides the ordinary slip, the adjustment and development of the internal secondary twinning from (11 1 ̄ ) Type I twin to 〈011〉 Type II/or (011) Type I twin, (001) compound twin and (111) Type I twin happen concurrently or in combination inside the SIM variants with the further deformation. The corresponding deformation mechanisms include stress induced reorientation of SIM substructural bands by the most favorably oriented twin system, stress induced migration of the SIM substructural boundary through internal twinning and stress induced injection of foreign SIM variant to the preexisting substructural bands.