Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate
Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate
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DOI：
10.1063/1.3474940
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发表时间：
2010-08-15
影响因子：
3.2
通讯作者：
Cain, M. G.
中科院分区：
文献类型：
--
作者：
Burnett, T. L.;Weaver, P. M.;Cain, M. G.
铁电陶瓷块体或薄膜材料的功能特性受到其纳米结构、晶体取向和结构几何形状的强烈影响。在本文中，我们展示了如何，通过结合纹理分析，通过电子背散射衍射，与piezoresponse力显微镜，定量测量的压电性能可以在25 nm的尺度，小于域的大小。结合技术被用来获得数据的域分辨有效的单晶压电响应的单个微晶在Pb（Zr（0.4）Ti（0.6））O（3）陶瓷。研究结果提供了深入了解域工程科学，并提供了一个工具，为未来发展的新的纳米结构的铁电材料的存储器，纳米执行器和传感器的基础上磁电多铁性。(C)2010年美国物理学会。[doi：10.1063/1.3474940]
The functional properties of ferroelectric ceramic bulk or thin film materials are strongly influenced by their nanostructure, crystallographic orientation, and structural geometry. In this paper, we show how, by combining textural analysis, through electron backscattered diffraction, with piezoresponse force microscopy, quantitative measurements of the piezoelectric properties can be made at a scale of 25 nm, smaller than the domain size. The combined technique is used to obtain data on the domain-resolved effective single crystal piezoelectric response of individual crystallites in Pb(Zr(0.4)Ti(0.6))O(3) ceramics. The results offer insight into the science of domain engineering and provide a tool for the future development of new nanostructured ferroelectric materials for memory, nanoactuators, and sensors based on magnetoelectric multiferroics. (C) 2010 American Institute of Physics. [doi:10.1063/1.3474940]