Electron and hole drift velocity in chemical vapor deposition diamond
Electron and hole drift velocity in chemical vapor deposition diamond
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DOI:
10.1063/1.3554721
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发表时间:
2011-03-15
影响因子:
3.2
通讯作者:
Isberg, Jan
中科院分区:
文献类型:
--
作者:
Gabrysch, Markus;Majdi, Saman;Isberg, Jan
The time-of-flight technique has been used to measure the drift velocities for electrons and holes in high-purity single-crystalline CVD diamond. Measurements were made in the temperature interval 83