Flat Field Soft X-ray Spectrometry with Reflection Zone Plates on a Curved Substrate
Flat Field Soft X-ray Spectrometry with Reflection Zone Plates on a Curved Substrate
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使用弯曲基底上的反射波带板进行平场软 X 射线光谱测定
DOI：
10.3390/app10207210
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发表时间：
2020
期刊：
影响因子：
--
通讯作者：
A. Erko
中科院分区：
文献类型：
--
作者：
J. Probst;C. Braig;A. Erko
我们报告了使用球形基底上的反射波带片 (RZP) 的新设计的高分辨率软 X 射线光谱仪获得的第一个实验结果。使用荧光源测试光谱仪。仅使用两个 RZP，以 150–750 eV 的间隔测量了设计能量周围 ±50% 范围内的高分辨率平场光谱：第一个 RZP 的设计能量为 277 eV，覆盖了 150–370 eV 的频带，第二个 RZP 的设计能量为 459 eV，覆盖了 350–750 eV 的频带，其中该能量的上边界范围由镍涂层定义 RZP。包括光学元件和探测器在内的光谱仪的绝对量子效率平均在10%以上，并且在RZP的设计能量下达到20%。对于 200-550 eV 核心范围内的能量 E，分辨率 E/ΔE 超过 600。
We report on the first experimental results obtained with a newly designed instrument for high-resolution soft X-ray spectroscopy, using reflection zone plates (RZPs) on a spherical substrate. The spectrometer was tested with a fluorescence source. High-resolution flat field spectra within ±50% around the design energies were measured at an interval of 150–750 eV, using only two RZPs: the first RZP, with its design energy of 277 eV, covered the band of 150–370 eV, and the second RZP, with a design energy of 459 eV, covered the band of 350–750 eV, where the upper boundary of this energy range was defined by the Ni coating of the RZPs. The absolute quantum efficiency of the spectrometer, including the optical element and the detector, was, on average, above 10%, and reached 20% at the designed energies of the RZPs. The resolving power E/∆E exceeded 600 for energies E inside the core range of 200–550 eV.