Absolute angle measurement using dual-wavelength laser speckle: Theory and method
Absolute angle measurement using dual-wavelength laser speckle: Theory and method
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DOI:
10.1016/j.optlaseng.2023.107956
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发表时间:
2024-03
影响因子:
4.6
通讯作者:
Sam J. Gibson;T. Charrett;R. Tatam
中科院分区:
文献类型:
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作者:
Sam J. Gibson;T. Charrett;R. Tatam
This paper presents a method utilising the speckle pattern formed by dual-wavelength illumination for the measurement of the two out-of-plane surface angles with respect to the sensor frame. Theoretical expressions are derived relating the observed speckle shift between patterns formed by two wavelengths for tilted surfaces with both on-axis and off-axis detector positions. These expressions are verified experimentally, showing RMS errors of between 0.5–1.0 Image 1. Finally, an on-axis implementation of the concept is presented using dual-wavelength illumination generated from two modes of a standard FP diode laser. Simplified expressions for the calculation of surface angles from measured speckle shift using this arrangement are presented, given in terms of three sensor constants; the responsivity or sensitivity of the sensor, C, and the zero surface tilt speckle shifts, A x 0 and A y 0. Experimental results using this sensor for a range of surface tilts between Image 2 and Image 3 showed an RMS error of Image 4 in θ x and Image 5 in θ y.