Correction of Surface Aberration in Strain Scanning Method with Analyzer
Correction of Surface Aberration in Strain Scanning Method with Analyzer
复制标题
用分析仪校正应变扫描法中的表面像差
DOI：
10.2472/jsms.55.101
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发表时间：
2006
期刊：
影响因子：
--
通讯作者：
Keisuke Tanaka
中科院分区：
文献类型：
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作者：
T. Shobu;J. Mizuki;Kenji Suzuki;Y. Akiniwa;Keisuke Tanaka
当测量体积下沉到样品表面以下时，衍射角发生偏移。因此，需要校正表面像差。用Ge（111）分析仪应变扫描法研究了S45C退火样品衍射角的变化。这种现象是由几何规范体积和仪器规范体积的质心差异引起的。这种差异可由以下因素解释：1）分析仪发散引起的测量容积变化，2）X射线穿透深度，3）由于分析仪设置错误导致的双接收狭缝之间的中心线间隙差距。在此基础上，提出了考虑这些因素的修正方法。对S45C喷丸试样的衍射角进行了测量和校正。残余应力的分布与去除法所得结果一致。
When a gauge volume sank below a specimen surface, the diffraction angle shifts. Thus, it is required to correct the surface aberration. For the annealed specimen of S45C, the shift in the diffraction angle was investigated using a strain scanning method with Ge (111) analyzer. This phenomenon was caused by the difference in the centroid between the geometric and the instrumental gauge volumes. This difference is explained by the following factors; 1) the change in the gauge volume by the divergence of the analyzer, 2) the X-ray penetration depth, 3) the gap of the centre line between the double receiving slits due to mis-setting the analyzer. As a result, the correcting method considered into these factors was proposed. For the shot-peened specimens of S45C, the diffraction angles were measured and corrected by our method. The distribution of the residual stress agreed with that obtained by the removal method.