Performance of an X-ray imaging detector based on a structured scintillator

Performance of an X-ray imaging detector based on a structured scintillator
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DOI:
10.1016/j.nima.2009.03.146
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发表时间:
2009-08-01
影响因子:
1.4
通讯作者:
Linnros, Jan
Linnros, Jan
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Svenonius, Olof;Sahlholm, Anna;Linnros, Jan

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结构化闪烁体板已被制成填充铊掺杂碘化铯(CsI)到硅孔阵列。它们的X射线成像特性已经使用标准牙科X射线源和电荷耦合器件(CCD)检测器进行了表征。结果表明,更精细结构的孔阵列提供上级成像分辨率,而它们的光输出较低。CCD中X射线量子的直接吸收是探测器噪声的重要贡献者。这可以通过使用厚光纤板或在某些情况下通过使用热像素软件算法来避免。(C)2009爱思唯尔有限公司版权所有。
Structured scintillator plates have been fabricated by filling thallium-doped caesium iodide (CsI) into a silicon pore array. Their X-ray imaging properties have been characterized using a standard dental X-ray source and a charge coupled device (CCD) detector. Results indicate that finer structured pore arrays provide superior imaging resolution while their light output is lower. Direct absorption of X-ray quanta in the CCD is a significant contributor of detector noise. This can be avoided by using a thick fibre optic plate or, in certain cases, by using a hot-pixel software algorithm. (C) 2009 Elsevier B.V. All rights reserved.