Epitaxial growth and optically pumped stimulated emission in AlGaN/InGaN ultraviolet multi-quantum-well structures
Epitaxial growth and optically pumped stimulated emission in AlGaN/InGaN ultraviolet multi-quantum-well structures
复制标题
AlGaN/InGaN 紫外多量子阱结构中的外延生长和光泵受激发射
DOI:
10.1007/s11664-019-07932-x
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发表时间:
2020
影响因子:
2.1
通讯作者:
Russell D. Dupuis
中科院分区:
文献类型:
--
作者:
Ping Chen;Young Jae Park;Yuh-Shiuan Liu;Theeradetch Detchprohm;P. Douglas Yoder;Shyh-Chiang Shen;Russell D. Dupuis
The thermal effect of the growth temperature on interface morphology and stimulated emission in ultraviolet AlGaN/InGaN multiple quantum wells (MQWs) are experimentally investigated. During the MOCVD epitaxial growth of AlGaN/InGaN MQWs, the ramping rate from a lower temperature for InGaN quantum wells (QWs) to a higher one for AlGaN quantum barriers (QBs) is intentionally changed from 1.0°C/s to 4.0°C/s. Atomic force microscopy images show that the surface morphology of InGaN QWs, which is improved by a thermal effect when the growth temperature rises to the set value of the AlGaN QBs, varies with different temperature ramping rates. The results of stimulated emission indicate that the threshold pumping power density of MQWs is decreased with increasing temperature ramping rate from 1.0°C/s to 3.0°C/s and then slightly increased when the ramping rate is 4.0°C/s. This phenomenon is believed to result from the thermal degradation effect during the temperature ramp step. A long-time high-temperature annealing will reduce the density of indium-rich microstructures as well as the corresponding localized state density, which is assumed to contribute to the radiative recombination in the InGaN QWs. Given the great difference between optimal growth temperatures for AlGaN and InGaN layers, a higher ramping rate would be more appropriate for the growth of ultraviolet AlGaN/InGaN MQWs.