Polarization microscopy probe for applications in a high magnetic field.
Polarization microscopy probe for applications in a high magnetic field.
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适用于高磁场应用的偏振显微镜探头。
DOI：
10.1063/1.2829155
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发表时间：
2008
期刊：
影响因子：
--
通讯作者：
G. Gottstein
中科院分区：
文献类型：
--
作者：
P. Konijnenberg;A. Ziemons;D. Molodov;G. Gottstein
介绍了一种用于高磁场磁体的显微探针。它是为了观察和连续测量磁性各向异性材料中磁驱动晶界的位置和形状而开发的。该方法利用可见光反射率的各向异性进行方向对比，确定边界位置。该系统的主要组成部分是带有摄像机的偏光显微镜和带有电阻加热器的样品室，用于在惰性气体气氛中在高达500摄氏度的高温下退火。给出了试验测量结果。
A microscopy probe designed for use in high field magnets is presented. It was developed to observe and continuously measure the position and shape of a magnetically driven grain boundary in a magnetically anisotropic material. The approach utilizes the anisotropy of reflectivity of visible light for orientation contrast to determine the boundary location. The major components of the system are the polarizing microscope with video camera and the sample chamber with a resistive heater for annealing at elevated temperatures up to 500 degrees C in an inert gas atmosphere. The results of test measurements are presented.