Performance Evaluation of Silicon Physically Unclonable Function by Studing Physicals Values
Performance Evaluation of Silicon Physically Unclonable Function by Studing Physicals Values
复制标题
通过研究物理值评估硅物理不可克隆功能的性能
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
L. Bossuet
中科院分区：
文献类型：
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作者：
Zhoua Cherif Jouini;J. Danger;L. Bossuet
本文提出了一种评估fpga中基于延迟元件的硅物理不可克隆函数（puf）的新方法。研究表征puf的指标是随机性、唯一性和稳定性。它们利用了组成PUF的基本元件的测量物理值。延迟分布提供了在物理层上量化PUF的兴趣，而不是在逻辑层上进行大量的实验来获得PUF id。一个由相同链组成的仲裁者PUF被认为是一个测试芯片，用所提出的指标来评估该方法。在CYCLONE II FPGA上进行了实验，实验结果表明所研究的PUF器件内性能良好。
This paper presents a novel approach to evaluate silicon Physically Unclonable Functions (PUFs) implemented in FPGAs and based on delay elements. The metrics studied to characterize the PUFs are randomness, Uniqueness and Steadiness. They take advantage of the measured physical values of elementary component making up the PUF. The delay distributions provide the interest to quantify the PUF at the physical level rather than carrying out a lot of experiments to get the PUF IDs at logical level. An Arbiter PUF composed of identical chains has been considered as a test chip to evaluate the method with the proposed metrics. Experiments have been carried out on CYCLONE II FPGA and the corresponding results shows the intra-device performance of the studied PUF.