Polarization-sensitive transfer matrix modeling for displacement measuring interferometry.
Polarization-sensitive transfer matrix modeling for displacement measuring interferometry.
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DOI：
10.1364/ao.396922
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发表时间：
2020-08
期刊：
影响因子：
1.9
通讯作者：
A. Bridges;A. Yacoot;T. Kissinger;R. Tatam
中科院分区：
文献类型：
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作者：
A. Bridges;A. Yacoot;T. Kissinger;R. Tatam
偏振光学用于光束导向和相位测量在位移测量干涉仪设计中的应用几乎是普遍的。以这种方式采用偏振光学的干涉仪设计对光学器件内由于材料界面的偏振泄漏和背反射而形成的不需要的光学腔的影响特别敏感。通常用于此类干涉仪设计的建模技术不适用于偏振光学的多次通过分析。一种技术，以及伴随的软件实现，在这里提出了能够通过线性平面光学元件的任意网络对单色平面波的传播进行建模。
The use of polarizing optics for both beam steering and phase measurement applications in displacement measuring interferometer designs is almost universal. Interferometer designs that employ polarizing optics in this manner are particularly sensitive to the effects of unwanted optical cavities that form within the optics due to polarization leakage and back reflections from material interfaces. Modeling techniques commonly employed in the design of such interferometers are poorly suited to the analysis of multiple passes through polarizing optics. A technique, along with an accompanying software implementation, is presented here that is capable of modeling the propagation of monochromatic plane waves through an arbitrary network of linear planar optical components.