IPM SYSTEMS FOR J-PARC RCS AND MR
IPM SYSTEMS FOR J-PARC RCS AND MR
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J-PARC RCS 和 MR 的 IPM 系统
DOI：
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
A. Ueno
中科院分区：
文献类型：
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作者：
K. Satou;S. Lee;T. Toyama;N. Hayashi;A. Ueno
残留气体电离剖面仪（IPM）被用于J-PARC RCS和MR，IPM是最有前途的无损剖面监测器之一。然而，在像J-PARC这样的高功率加速器中使用，其束流强度将超过每束4 E13粒子，这是具有挑战性的，因为应该仔细估计与强束流的空间电荷电场的干扰。介绍了该系统的概况和现状。讨论了RCS IPM的外电场误差和电子收集模式的污染问题。
Residual gas Ionization Profile Monitors (IPMs) are used at the J-PARC RCS and MR. The IPM is one of the most promising nondestructive profile monitor. However, usage in the high power accelerator like J-PARC, whose beam intensity will overcome 4E13 particle per bunch, is challenging, because interferences with the space charge electric field of the intense beam should be carefully estimated. The overview of the systems and the present statuses are described. The external electric field error of the RCS IPM, and the issue on contaminations on the electron collection mode are also discussed.