Reduction of multi-photon ionization in dielectrics due to collisions
Reduction of multi-photon ionization in dielectrics due to collisions
复制标题
DOI：
10.1007/bf01831002
复制
发表时间：
1996-12
期刊：
影响因子：
--
通讯作者：
D. Du;X. Liu;G. Mourou
中科院分区：
文献类型：
--
作者：
D. Du;X. Liu;G. Mourou
研究了介电材料中多光子电离过程引起的碰撞效应。我们发现，对于 55 fs 和 100 fs 的线偏振光和圆偏振光，熔融石英的击穿阈值是相同的，我们认为这表明固体中多光子电离受到抑制。通过对与散射相关的时间相关薛定谔方程进行数值求解，我们首次观察到由于碰撞而导致电介质中多光子电离率的大幅降低。
The collisional effect due to the multi-photon ionization process in dielectric material has been studied. We found that the breakdown threshold of fused silica is the same for both linearly and circularly polarized light at 55 fs and 100 fs, which we believe is an indication of the suppression of multi-photon ionization in solids. By numerically solving the time-dependent Schrödinger equation with scattering, for the first time, we have observed substantial reduction of the multi-photon ionization rate in dielectrics due to collisions.