Three-Dimensional Profiling of Refractive Index Distribution inside Transparent Materials by Use of Nonresonant Four-Wave Mixing Microscopy
Three-Dimensional Profiling of Refractive Index Distribution inside Transparent Materials by Use of Nonresonant Four-Wave Mixing Microscopy
复制标题
使用非共振四波混合显微镜对透明材料内部折射率分布进行三维分析
DOI：
10.1143/apex.1.022006
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发表时间：
2008
影响因子：
2.3
通讯作者：
K. Itoh
中科院分区：
文献类型：
--
作者：
K. Isobe;T. Kawasumi;T. Tamaki;S. Kataoka;Y. Ozeki;K. Itoh
我们提出四波混频（FWM）显微术可以应用于透明样品内部折射率（RI）结构的三维映射。我们推导出的RI和四波混频信号的强度，这是由于非共振光学非线性之间的解析关系。利用这一关系，可以从四波混频信号的强度分布直接定量地得到折射率的分布。我们实验证明了在无碱玻璃中制作的相位光栅的RI轮廓。
We propose that four-wave mixing (FWM) microscopy can be applied to three-dimensional mapping of refractive index (RI) structure inside transparent samples. We derive an analytical relationship between the RI and the intensity of the FWM signal that is due to nonresonant optical nonlinearity. By using the relationship, the RI profile can be directly and quantitatively obtained from the intensity distribution of the FWM signal. We experimentally demonstrate the RI profiling of a phase grating fabricated in a non-alkali glass.