Study of Localized Character of 4f Electrons and Ultrasonic Dispersions in SmOs4Sb12 by High-Pressure High-Frequency Ultrasonic Measurements
Study of Localized Character of 4f Electrons and Ultrasonic Dispersions in SmOs4Sb12 by High-Pressure High-Frequency Ultrasonic Measurements
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高压高频超声测量SmOs4Sb12中4f电子和超声弥散的局域特性研究
DOI：
10.1103/physrevb.94.085142
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
and M. B. Maple
中科院分区：
文献类型：
--
作者：
S. Mombetsu;T. Murazumi;H. Hidaka;T. Yanagisawa;H. Amitsuka;P.-C. Ho;and M. B. Maple
