SURFACE-ENHANCED RAMAN SCATTERING
SURFACE-ENHANCED RAMAN SCATTERING
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DOI:
10.1007/1-4020-4611-1_12
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发表时间:
2006
期刊:
影响因子:
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通讯作者:
T. Vo‐Dinh;Fei Yan
中科院分区:
文献类型:
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作者:
T. Vo‐Dinh;Fei Yan
AbstractIn 1928, Sir C.V. Raman documented the phenomenon of inelastic light scattering1. Radiation scattered by molecules contains photons with the same frequency as the incident radiation, but may also contain photons with changed or shifted frequency. This effect is very weak - approximately one photon out of a million (0.0001%) will scatter from that sample at a wavelength slightly shifted from the original wavelengths. The process was later named after him, with the shifting of frequency referred to as the Raman effect and the frequently-shifted light as Raman radiation. Raman spectroscopy is based on vibrational transitions that yield very narrow spectral features which are characteristic of the investigated sample. Thus, it has long been regarded as a valuable tool for the identification of chemical and biological samples as well as the elucidation of molecular structure, surface processes, and interface reactions. Despite such advantages, Raman scattering suffers the disadvantage of extremely poor efficiency. Compared to luminescence-based processes Raman spectroscopy has an inherently small cross-section (e.g. 10-30cm2per molecule), thus precluding the possibility of analyte detection at low concentration levels without special enhancement processes. Some modes of signal enhancement have included resonance Raman scattering and nonlinear processes such as coherent anti- Stokes Raman scattering. However, the need for high-power, multiplewavelength excitation sources has limited the widespread use of these techniques.