High resolution spatial mapping of the electrocaloric effect in a multilayer ceramic capacitor using scanning thermal microscopy
High resolution spatial mapping of the electrocaloric effect in a multilayer ceramic capacitor using scanning thermal microscopy
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DOI：
10.1088/2515-7655/acf7f1
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发表时间：
2023-09
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通讯作者：
Olivia E Baxter;Amit Kumar;J. M. Gregg;R. G. McQuaid
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作者：
Olivia E Baxter;Amit Kumar;J. M. Gregg;R. G. McQuaid
扫描热显微镜 (SThM) 正在成为一种基于原子力显微镜的强大平台，用于绘制纳米尺度上的动态温度分布。然而，迄今为止，使用该技术对电热（EC）材料的温度变化进行空间成像还非常有限。我们以 Kar-Narayan 等人 (2013 Appl. Phys. Lett. 102 032903) 和 Shan 等人 (2020 Nano Energy 67 104203) 的先前工作为基础，表明 SThM 可用于在微观长度尺度上空间映射 EC 温度变化，这里在商用多层陶瓷电容器中进行了演示。在我们的方法中，EC 响应是在点对点间隔小至 125 nm 的离散位置测量的，从而可以重建加热和冷却的空间图及其时间演变。该技术提供了一种研究亚微米长度尺度 EC 响应的方法，而更常用的红外热成像方法无法轻松获得这种响应。
Scanning thermal microscopy (SThM) is emerging as a powerful atomic force microscope based platform for mapping dynamic temperature distributions on the nanoscale. To date, however, spatial imaging of temperature changes in electrocaloric (EC) materials using this technique has been very limited. We build on the prior works of Kar-Narayan et al (2013 Appl. Phys. Lett. 102 032903) and Shan et al (2020 Nano Energy 67 104203) to show that SThM can be used to spatially map EC temperature changes on microscopic length scales, here demonstrated in a commercially obtained multilayer ceramic capacitor. In our approach, the EC response is measured at discrete locations with point-to-point separation as small as 125 nm, allowing for reconstruction of spatial maps of heating and cooling, as well as their temporal evolution. This technique offers a means to investigate EC responses at sub-micron length scales, which cannot easily be accessed by the more commonly used infrared thermal imaging approaches.