Convex Source Support and Its Application to Electric Impedance Tomography
Convex Source Support and Its Application to Electric Impedance Tomography
复制标题
凸源支撑及其在电阻抗层析成像中的应用
DOI：
10.1137/080715640
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发表时间：
2008
期刊：
影响因子：
--
通讯作者：
S. Reusswig
中科院分区：
文献类型：
--
作者：
M. Hanke;N. Hyvönen;S. Reusswig
电阻抗层析成像的目的是从电流和电压的边界测量中恢复物理体内的电导率。在许多具有实际重要性的情况下，所研究的对象具有已知的背景电导率，但受到不均匀性的污染。在这项工作中，我们试图仅从一对阻抗层析成像测量中提取有关二维物体内此类内含物支持的所有可能信息。我们的非迭代且计算成本低廉的方法基于凸源支持的概念，该概念源于Kusiak、Sylvester和作者的早期工作。各种数值实验证明了算法的功能性。
The aim in electric impedance tomography is to recover the conductivity inside a physical body from boundary measurements of current and voltage. In many situations of practical importance, the investigated object has known background conductivity but is contaminated by inhomogeneities. In this work, we try to extract all possible information about the support of such inclusions inside a two-dimensional object from only one pair of measurements of impedance tomography. Our noniterative and computationally cheap method is based on the concept of the convex source support, which stems from earlier works of Kusiak, Sylvester, and the authors. The functionality of our algorithm is demonstrated by various numerical experiments.
静电学的来源支持
影响因子：
1.5
作者：
M. Hanke;Nuutti Hyvönen;M. Lehn;S. Reusswig
通讯作者：
S. Reusswig
通过电极测量近似电阻抗断层扫描的理想化边界数据
影响因子：
3.5
作者：
Nuutti Hyvönen
通讯作者：
Nuutti Hyvönen