Interface stress in polycrystalline materials: the case of nanocrystalline Pd.
Interface stress in polycrystalline materials: the case of nanocrystalline Pd.
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多晶材料中的界面应力：纳米晶 Pd 的情况。
DOI：
10.1103/physrevlett.88.206104
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发表时间：
2002
影响因子：
8.6
通讯作者：
P. Zimmer
中科院分区：
文献类型：
--
作者：
R. Birringer;M. Hoffmann;P. Zimmer
基于固体毛细管方程的推广，我们发展了一种测量大界面体积比多晶样品晶界应力绝对值的方法。用X射线衍射法测量了纳米Pd的平均晶粒度和残余无应变晶格间距，计算出纳米Pd的晶界应力为1.2+/-0.1N/m，样品中微晶取向的随机分布表明该值是Pd中大角度晶界的特征。
Based on a generalization of a capillary equation for solids, we develop a method for measuring the absolute value of grain-boundary stress in polycrystalline samples having a large interface-to-volume ratio. The grain-boundary stress in nanocrystalline Pd is calculated from x-ray diffraction measurements of the average grain size and the residual-strain-free lattice spacings, yielding a value of 1.2+/-0.1 N/m. The random distribution of crystallite orientations in the sample suggests that this value is characteristic of high-angle grain boundaries in Pd.