Instrumentation for dual-probe scanning near-field optical microscopy
Instrumentation for dual-probe scanning near-field optical microscopy
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DOI：
10.1063/1.4737883
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发表时间：
2012-08-01
影响因子：
1.6
通讯作者：
Kawakami, Y.
中科院分区：
文献类型：
--
作者：
Kaneta, A.;Fujimoto, R.;Kawakami, Y.
为了研究局域载流子的运动，我们研制了一种双探针扫描近场光学显微镜（SNOM），它有两个光纤探针，一个用于光激发，另一个用于光收集。该仪器基于两个重要技术：探针结构的设计和样品表面与两个探针之间的距离控制。采用时域有限差分法对设计方案进行了数值分析和优化，实现了高效率的光激发和光收集，同时采用双波段调制实现了距离控制。使用不同频率的探针尖端的振荡的真实的实时检测独立地控制探针尖端和样品表面之间的距离以及两个探针之间的距离。因此，收集探针可以在照明探针周围扫描，而不会损坏探针尖端。为了证明我们的SNOM，我们在双探针配置下进行光致发光光谱，并观察InGaN量子阱中的载流子运动。(C)2012年美国物理学会。[http：//dx.doi.org/10.1063/1.4737883]
To investigate local carrier motions, we developed a dual-probe scanning near-field optical microscope (SNOM) with two fiber probes where one is for photoexcitation and the other is for light collection. This instrumentation is based on two important techniques: the design of probe structures and distance control between the sample surface and the two probes. A finite-difference time-domain method numerically analyzed and optimized the design for high efficiency photoexcitation and light collection, while a dual band modulation realized distance control. Real time detection of the oscillations of the probe tips using different frequencies independently controls the distance between the probe tip and the sample surface as well as the distance between the two probes. Thus, the collection probe can be scanned around an illumination probe without destroying the probe tips. To demonstrate our SNOM, we performed photoluminescence spectroscopy under the dual-probe configuration and observed carrier motions in an InGaN quantum well. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4737883]