Balance of the stored energies sustained by the internal and edge transport barriers and effects of ELMs and L–H transitions in JT-60U
Balance of the stored energies sustained by the internal and edge transport barriers and effects of ELMs and L–H transitions in JT-60U
复制标题
JT-60U 中内部和边缘传输势垒以及 ELM 和 L-H 跃迁的影响所维持的存储能量的平衡
DOI：
10.1088/0029-5515/49/9/095014
复制
发表时间：
2009
期刊：
影响因子：
3.3
通讯作者：
A. Isayama
中科院分区：
文献类型：
--
作者：
Y. Kamada;M. Yoshida;Y. Sakamoto;Y. Koide;N. Oyama;H. Urano;K. Kamiya;T. Suzuki;A. Isayama
在JT-60U托卡马克装置上研究了边缘输运势垒(ETB)和内部输运势垒(ITB)之间的关联，以了解在先进托卡马克装置中决定等离子体动力学参数径向分布的关键物理过程。结果表明，对于I型Elming H型等离子体，在较宽的等离子体电流范围内，边缘基座极向ββp-Ped几乎与总的极向ββp-Tot成线性关系，并且这种依赖关系随着三角度的增加而增强。这种依赖关系不是由于型材刚度造成的，因为无论是否存在ITB，这种依赖关系都是相同的。随着ITB-Foot半径内储能(WITB)的增加，总储能(Wth)增加，基座储能(WPed)增加。另一方面，随着WPED的增加，榆树的穿透范围向内扩展，最终达到ITB-英尺半径。在这种情况下，由于榆树的侵蚀，ITB-Foot的半径无法向外移动。那么Witb/Wth和Wed/Wth的分数几乎是恒定的。研究还发现，I型ELM排出/减少的边缘环向动量大于边缘离子热能。环形旋转的ELM穿透比离子温度的穿透更深，可以超过ITB英尺半径。同向旋转等离子体的ELM穿透深度大于CTR旋转等离子体。在这两种情况下，ELM穿透深度的大小依次为环向旋转(Vt)、离子温度(Ti)、电子温度(Te)。L-H相变对Vt剖面的影响也大于对Ti剖面的影响。在L-H相变时，基座Vt突然向Ctr方向移动，而Ti没有变化，然后基座Vt在较慢的时间尺度上随着基座Ti的生长而进一步增长。ELMS和L-H跃迁引起的Vt的这种变化可能影响ITBS的降解/进化。
To understand key physics processes determining radial profiles of the kinetic plasma parameters in the advanced tokamak operation scenarios, correlations between the edge transport barrier (ETB) and the internal transport barrier (ITB) have been studied in the JT-60U tokamak device. It has been found that the edge pedestal poloidal beta, βp-ped, increases almost linearly with the total poloidal beta, βp-tot, over a wide range of the plasma current for type I ELMing H-mode plasmas, and this dependence becomes stronger with increasing triangularity. This dependence is not due to the profile stiffness, since the dependence is the same regardless of the existence of ITB. As the stored energy inside the ITB-foot radius (WITB) increases, the total thermal stored energy (Wth) increases and then the pedestal stored energy (Wped) increases. On the other hand, as Wped increases, the ELM penetration expands more inwards and finally reaches the ITB-foot radius. At this situation, the ITB-foot radius cannot move outwards because of the erosion by ELMs. Then the fractions of WITB/Wth and Wped/Wth become almost constant. It has also been found that the type I ELM expels/decreases the edge toroidal momentum larger than the edge ion thermal energy. The ELM penetration for the toroidal rotation tends to be deeper than that for the ion temperature and can exceed the ITB-foot radius. The ELM penetration is deeper for CO-rotating plasmas than CTR rotating plasmas. In both cases, the ELM penetration is deeper in the order of the toroidal rotation (Vt), the ion temperature (Ti) and then the electron temperature (Te). The L–H transition also changes the Vt profile more significantly than the Ti profile. At the L–H transition, the pedestal Vt shifts into the CTR-direction deeply and suddenly without a change in Ti, and then the pedestal Vt grows further together with a growth of the pedestal Ti in a slower timescale. Such changes in Vt by ELMs and L–H transitions may affect degradation/evolution of ITBs.
登录
查看更多内容
影响因子：
3.3
作者：
H. Urano;N. Oyama;K. Kamiya;Y. Koide;H. Takenaga;T. Takizuka;M. Yoshida;Y. Kamada
通讯作者：
H. Urano;N. Oyama;K. Kamiya;Y. Koide;H. Takenaga;T. Takizuka;M. Yoshida;Y. Kamada
影响因子：
3.3
作者：
Minoru Yoshida;Y. Koide;H. Takenaga;H. Urano;Naoyuki Oyama;K. Kamiya;Yoshiteru Sakamoto;G. Matsunaga;Yutaka Kamada
通讯作者：
Minoru Yoshida;Y. Koide;H. Takenaga;H. Urano;Naoyuki Oyama;K. Kamiya;Yoshiteru Sakamoto;G. Matsunaga;Yutaka Kamada
影响因子：
3.3
作者：
Shimada, M.;Campbell, D. J.;Sipps, A. C. C.
通讯作者：
Sipps, A. C. C.
JT-60U先进托卡马克运行模式下边缘基座特性对综合性能的影响
DOI：
--
发表时间：
2006
期刊：
Plasma Physics and Controlled Fusion 48
影响因子：
--
作者：
S.Ohdachi;et.al.;H.Urano;Y.Nakashima;H. Urano;Y. Nakashima;N.Oyama;H.Urano;J.Bucalossi;H.Takenaga;H.Takenaga;N. Oyama;H. Urano;J. Bucalossi;H. Takenaga;H. Takenaga;H. Takenaga;K.Kamiya;N.Oyama;H.Urano;Y.Kamada
通讯作者：
Y.Kamada
JT-60U环形旋转剖面的物理机制和动量传输特性
DOI：
--
发表时间：
--
期刊：
Plasma and Fusion Research 印刷中
影响因子：
--
作者：
Hiroki Hasegawa;Seiji Ishiguro;Masao Okamoto;長谷川 裕記;M. Yoshida;M. Yoshida;M.Yoshida;M.Yoshida;Y.Kamada;M.Yoshida;M. Yoshida
通讯作者：
M. Yoshida