Wide Line Surface-Enhanced Raman Scattering Mapping
Wide Line Surface-Enhanced Raman Scattering Mapping
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DOI：
10.1002/admt.201900999
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发表时间：
2020-06-01
影响因子：
6.8
通讯作者：
Boisen, Anja
中科院分区：
文献类型：
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作者：
Ilchenko, Oleksii;Slipets, Roman;Boisen, Anja
基于表面增强拉曼光谱(SERS)的极低浓度分子检测通常依赖于SERS底物的绘制。这产生了大量(>；1000)SERS光谱，可以提高检测极限；然而，信号采集时间是一个主要限制因素。在这项工作中，提出了一种宽线(WL)激光聚焦技术，旨在快速绘制SERS衬底。WL技术可以在几秒钟内获取数千个SERS光谱，而不会遗漏照明区域中的任何电磁“热点”。此外，在WL模式下对线路上的SERS信号进行平均显示出极高的信噪比。使用不同的分析物分子，即对香豆酸和三聚氰胺，验证了WL技术用于SERS传感的优势。结果表明，与商用拉曼显微镜相比，该方法的检测下限可提高一个数量级。
Surface-enhanced Raman spectroscopy (SERS)-based molecular detection at extremely low concentrations often relies on mapping of a SERS substrate. This yields a large number (>1000) of SERS spectra that can improve the limit of detection; however, the signal collection time is a major constraint. In this work, a wide line (WL) laser focusing technique aimed at fast mapping of SERS substrates is presented. The WL technique enables acquisition of thousands of SERS spectra in a few seconds without missing any of the electromagnetic "hot spots" in the illuminated area. In addition, the SERS signal averaging across the line in the WL mode displays extremely high signal-to-noise ratios. The advantages of the WL technique for SERS-based sensing are verified using different analyte molecules, that is, p-coumaric acid and melamine. Results show that the limit of detection can be improved by one order of magnitude compared to results obtained using a commercial Raman microscope.