Holographic principles in antenna metrology at millimeter and submillimeter wavelengths

Holographic principles in antenna metrology at millimeter and submillimeter wavelengths
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发表时间：
2015-04
期刊：
2015 9th European Conference on Antennas and Propagation (EuCAP)
影响因子：
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通讯作者：
A. Raisanen;J. Ala-Laurinaho
A. Raisanen;J. Ala-Laurinaho
中科院分区：
其他
文献类型：
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作者：
A. Raisanen;J. Ala-Laurinaho

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讨论了毫米和亚毫米波段天线计量中的全息原理。可以应用全息原理，在确定大反射器的表面精度、在近场天线测量中的相位恢复、在通过具有近场反射负载的输入反射系数测量的天线方向图恢复中，或者在产生用于测量的平面波条件（基于全息图的紧凑天线测试范围）中。
Holographic principles used in antenna metrology at millimeter and submillimeter wavelengths are discussed. Holographic principles may be applied, e.g., in determining the surface accuracy of large reflectors, in phase retrieval in nearfield antenna measurements, in antenna pattern retrieval through input reflection coefficient measurement with reflective load in near-field, or in producing the plane wave conditions for the measurement (a hologram based compact antenna test range).