X-ray absorption spectroscopy and magnetic circular dichroism studies of L10-Mn-Ga thin films

X-ray absorption spectroscopy and magnetic circular dichroism studies of L10-Mn-Ga thin films
复制标题

L10-Mn-Ga薄膜的X射线吸收光谱和磁圆二色性研究

DOI:
--
复制
发表时间:
2013
期刊:
影响因子:
--
通讯作者:
G. Reiss
G. Reiss
中科院分区:
--
文献类型:
--
作者:
M. Glas;D. Ebke;C. Sterwerf;J. Schmalhorst;C. Jenkins;E. Arenholz;G. Reiss

文献摘要

被引文献

相似文献

0.1<x<2的四方畸变Mn3−xGax薄膜具有较强的垂直磁各向异性和较低的磁化强度,因此具有作为自旋传递转矩磁随机存取存储器电极的潜力。由于氧化物的形成,直接用MgO覆盖这些薄膜是有问题的,我们通过元素特异性x射线吸收光谱(XAS)和磁圆二色性(XMCD)研究了CoFeB中间层和两种不同的MgO屏障沉积方法对Mn62Ga38界面Mn-O形成的影响。通过x射线衍射测量证实了Mn-Ga薄膜具有高度织构的L10晶体结构。对于具有电子束蒸发MgO势垒的样品,没有发现Mn-O的证据,而在磁控溅射MgO的样品中,即使是最厚的层间厚度,也检测到Mn-O。XAS和XMCD测量均表明,随着CoFeB层间厚度的减小,界面Mn-O含量增加。额外的元素特定的f…
Tetragonally distorted Mn3−xGax thin films with 0.1<x<2 show a strong perpendicular magnetic anisotropy and low magnetization and thus have the potential to serve as electrodes in spin transfer torque magnetic random access memory. Because a direct capping of these films with MgO is problematic due to oxide formation, we examined the influence of a CoFeB interlayer and of two different deposition methods for the MgO barrier on the formation of interfacial Mn-O for Mn62Ga38 by element specific X-ray absorption spectroscopy (XAS) and magnetic circular dichroism (XMCD). A highly textured L10 crystal structure of the Mn-Ga films was verified by X-ray diffraction measurements. For samples with e-beam evaporated MgO barrier no evidence for Mn-O was found whereas in samples with magnetron sputtered MgO, Mn-O was detected, even for the thickest interlayer thickness. Both XAS and XMCD measurements showed an increasing interfacial Mn-O amount with decreasing CoFeB interlayer thickness. Additional element specific f...