Low-complexity fault simulation under the multiple observation time testing approach
Low-complexity fault simulation under the multiple observation time testing approach
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多观测时间测试方法下的低复杂度故障模拟
DOI：
10.1109/test.1995.529842
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发表时间：
1995
期刊：
影响因子：
--
通讯作者：
S. Reddy
中科院分区：
文献类型：
--
作者：
I. Pomeranz;S. Reddy
采用三值逻辑进行同步时序电路的故障模拟，可能会导致故障模拟精度的降低，从而导致故障覆盖范围被低估。此外，由于所采用的测试策略，可能会出现故障覆盖损失。这些问题以前是以高计算复杂度为代价来缓解的。我们提出了一种观察，允许我们在许多情况下减轻故障覆盖的损失，其计算成本与传统的三值故障模拟相似。将所提出的仿真程序与先前提出的仿真程序进行了比较，以证明其有效性。
The use of three-value logic for fault simulation of synchronous sequential circuits may incur a loss of accuracy that would cause the fault coverage to be underestimated. In addition, loss of fault coverage may occur due to the test strategy employed. These problems were previously alleviated at the cost of high computational complexity. We present an observation that allows us to alleviate loss of fault coverage in many cases, at a computational cost similar to conventional three-value fault simulation. The proposed simulation procedure is compared to a previously proposed one to demonstrate its effectiveness.