Nanoscale Elemental Sensitivity Study of Nd2Fe14B Using Absorption Correlation Tomography
Nanoscale Elemental Sensitivity Study of Nd2Fe14B Using Absorption Correlation Tomography
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DOI：
10.1002/jemt.22273
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发表时间：
2013-11-01
影响因子：
2.5
通讯作者：
Yang, Wenge
中科院分区：
文献类型：
--
作者：
Kao, Thomas L.;Shi, Crystal Y.;Yang, Wenge
透射X射线显微镜（TXM）是一种快速发展的具有纳米级三维（3D）真实空间成像能力的技术。结合来自同步加速器源的宽范围的能量可调谐性，TXM使得能够检索具有元素/化学灵敏度的3D微观结构信息，否则将无法访问。假设感兴趣的元素的吸收边缘被相当好地分离，吸收边缘之上和之下的差分吸收对比度已经被用于重建不同元素的分布。在这里，我们提出了一种吸收相关层析（ACT）方法的基础上的相关性的材料吸收跨多个边缘。ACT克服了由重叠吸收边引起的显著限制，显著扩展了TXM的能力，并且使得具有化学/元素灵敏度的完全定量的纳米尺度3D结构研究成为可能。这种新方法的能力和鲁棒性证明了一个重要类型的稀土磁体（Nd 2Fe 14 B）的案例研究。Microsc. Res. Tech. 76：1112-1117，2013. (c)2013 Wiley Periodicals，Inc.
Transmission X-ray microscopy (TXM) is a rapidly developing technique with the capability of nanoscale three dimensional (3D) real-space imaging. Combined with the wide range in energy tunability from synchrotron sources, TXM enables the retrieval of 3D microstructural information with elemental/chemical sensitivity that would otherwise be inaccessible. The differential absorption contrast above and below absorption edges has been used to reconstruct the distributions of different elements, assuming the absorption edges of the interested elements are fairly well separated. Here we present an Absorption Correlation Tomography (ACT) method based on the correlation of the material absorption across multiple edges. ACT overcomes the significant limitation caused by overlapping absorption edges, significantly expands the capabilities of TXM, and makes it possible for fully quantitative nano-scale 3D structural investigation with chemical/elemental sensitivity. The capability and robustness of this new methodology is demonstrated in a case study of an important type of rare earth magnet (Nd2Fe14B). Microsc. Res. Tech. 76:1112-1117, 2013. (c) 2013 Wiley Periodicals, Inc.