THE RECOMBINATION CORRECTION FOR AN IONIZATION-CHAMBER EXPOSED TO PULSED RADIATION IN A SWEPT BEAM TECHNIQUE .1. THEORY
THE RECOMBINATION CORRECTION FOR AN IONIZATION-CHAMBER EXPOSED TO PULSED RADIATION IN A SWEPT BEAM TECHNIQUE .1. THEORY
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DOI:
10.1088/0031-9155/27/2/001
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发表时间:
1982-01-01
影响因子:
3.5
通讯作者:
BOAG, JW
中科院分区:
文献类型:
--
作者:
BOAG, JW
The established theory for the collection efficiency of an ionisation chamber irradiated by a series of uniform short pulses is extended to the more complex case of irradiation in a pulsed and electromagnetically swept electron beam. The radial variation of exposure rate is assumed to be Gaussian with scale constant equal to a, and the pulses are assumed to be uniformly distributed over the area swept out. A formula for the collection efficiency is derived and the influence of varying some of the parameters is studied. The collection efficiency, phi 1, at voltage V 1 can be calculated if the two dosemeter readings, Q 1 and Q 2, at two widely different chamber voltages, V 1 and V 2, are known, phi 1 depends primarily upon the ratios Q 1/Q 2 and V 1/V 2 and to a much lesser extent upon the geometry of the chamber or the ratio of Gaussian scale constant to a typical linear dimension of the field scanned. Charts for calculating phi 1 are provided.