Test and extraction methods for the QC parameters of silicon strip sensors for ATLAS upgrade tracker
Test and extraction methods for the QC parameters of silicon strip sensors for ATLAS upgrade tracker
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ATLAS升级跟踪器硅带传感器QC参数测试与提取方法
DOI：
10.1016/j.nima.2022.167608
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发表时间：
2023
期刊：
影响因子：
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通讯作者：
Rousso D
中科院分区：
文献类型：
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作者：
Rousso D
ATLAS内部探测器升级的内部跟踪器（ITk）的预生产条形传感器的质量控制（QC）已经完成，合作已经开始了生产传感器的QC测试计划。该计划将持续3年多，包括对大约22000个传感器的评估。8种类型的传感器，2桶和6端盖，将在许多不同的合作机构进行测量。组合QC流程的持续吞吐量要求为每月总计约500个传感器。已根据与供应商商定的条款制定测量方案并定义验收标准。为了有效监测测试结果，在整个协作过程中商定了通用数据文件格式。为了能够评估由各种合作机构的许多不同测试设置产生的测试结果，已经开发了通用算法来整理、评估、绘制和上传测量数据。这允许客观地应用通过/失败标准和汇编相应的产量数据。迄今为止，这些脚本已用于处理3000多个传感器的数据，并有助于识别故障传感器和监控QC测试进度。
The Quality Control (QC) of pre-production strip sensors for the Inner Tracker (ITk) of the ATLAS Inner Detector upgrade has finished, and the collaboration has embarked on the QC test programme for production sensors. This programme will last more than 3 years and comprises the evaluation of approximately 22000 sensors. 8 Types of sensors, 2 barrel and 6 endcap, will be measured at many different collaborating institutes. The sustained throughput requirement of the combined QC processes is around 500 sensors per month in total. Measurement protocols have been established and acceptance criteria have been defined in accordance with the terms agreed with the supplier. For effective monitoring of test results, common data file formats have been agreed upon across the collaboration. To enable evaluation of test results produced by many different test setups at the various collaboration institutes, common algorithms have been developed to collate, evaluate, plot and upload measurement data. This allows for objective application of pass/fail criteria and compilation of corresponding yield data. These scripts have been used to process the data of more than 3000 sensors so far, and have been instrumental for identification of faulty sensors and monitoring of QC testing progress.
CMS 微带硅探测器中多防护结构的击穿特性得到改善
DOI：
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发表时间：
2001
期刊：
影响因子：
--
作者：
N. Bacchetta;D. Bisello;A. Candelori;M. Rold;M. Descovich;A. Kaminski;A. Messineo;F. Rizzo;G. Verzellesi
通讯作者：
G. Verzellesi