Multiple scattering limit in optical microscopy
Multiple scattering limit in optical microscopy
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DOI：
10.1364/oe.25.028914
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发表时间：
2017-11-13
期刊：
影响因子：
3.8
通讯作者：
Aubry, Alexandre
中科院分区：
文献类型：
--
作者：
Badon, Amaury;Boccara, A. Claude;Aubry, Alexandre
光学显微镜提供了亚微米分辨率和最小侵入性的生物结构的独特见解。然而，样品本身的不均匀性会引起光的多次散射和光学像差，从而限制了对接近表面的深度的观察。为了定量地预测显微镜下的穿透深度，我们从理论上推导了反射中的单倍散射比。从这个关键量出发，推导出了各种显微成像技术如共聚焦显微镜、光学相干层析成像及相关方法的多重散射极限。(C) 2017年美国光学学会
Optical microscopy offers a unique insight of biological structures with a sub-micrometer resolution and a minimum invasiveness. However, the inhomogeneities of the specimen itself can induce multiple scattering of light and optical aberrations which limit the observation to depths close to the surface. To predict quantitatively the penetration depth in microscopy, we theoretically derive the single-to-multiple scattering ratio in reflection. From this key quantity, the multiple scattering limit is deduced for various microscopic imaging techniques such as confocal microscopy, optical coherence tomography and related methods. (C) 2017 Optical Society of America