Transmission electron microscopy of experimentally deformed chalcopyrite single crystals
Transmission electron microscopy of experimentally deformed chalcopyrite single crystals
复制标题
实验变形黄铜矿单晶的透射电子显微镜
DOI：
--
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发表时间：
1986
影响因子：
1.4
通讯作者：
C. Hennig
中科院分区：
文献类型：
--
作者：
J. Couderc;C. Hennig
用透射电子显微镜研究了两种在200℃实验变形的天然黄铜矿CuFeS_2晶体。激活的滑动面为(001)和{112}。(001)中的位错具有Burgers矢[110]和主要的边缘特征。它们被分成两个共线分项b=1/2[110]，并且可以交叉分成{112}。{112}中的位错由沿低折射率晶格线的直线段组成。它们通常排列成偶极子，形成环路的轨迹。B=1/2的位错很少[
$$上划线{11}$$
1]和[1
$$AR 1$$
0]存在且位错为b=[0
$$AR 2$$
1]出现在低角度亚晶界。从弱束对比中推测，在{112}中滑动的大多数位错具有b=1/2<3
$$上划线{11}$$
>。它们被分解成最多四个部分。在{112}中还存在微孪晶和不同类型的层错。讨论了位错离解的模型。
AbstractTwo crystals of natural chalcopyrite, CuFeS2, experimentally deformed at 200° C have been studied by means of transmission electron microscopy (TEM). The activated glide planes are (001) and {112}. The dislocations in (001) have the Burgers vector [110] and a predominating edge character. They are split into two colinear partials b=1/2[110] and can cross split into {112}. The dislocations in {112} consist of straight segments along low index lattice lines. They are often arranged in dipoles generating trails of loops. Few dislocations with b=1/2[
$$overline {11} $$
1] and [1
$$ar 1$$
0] are present and dislocations with b=[0
$$ar 2$$
1] occur in low angle subgrain boundaries. From weak beam contrasts it is presumed that most of the dislocations gliding in {112} have b=1/2〈3
$$overline {11} $$
〉. They are dissociated into up to four partials. Microtwins and different types of stacking faults in {112} also occur. Models of the dissociation of dislocations are discussed.