Scanning Nonlinear Dielectric Microscope Using a Lumped Constant Resonator Probe and Its Application to Investigation of Ferroelectric Polarization Distributions
Scanning Nonlinear Dielectric Microscope Using a Lumped Constant Resonator Probe and Its Application to Investigation of Ferroelectric Polarization Distributions
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使用集总常数谐振探头的扫描非线性介电显微镜及其在铁电极化分布研究中的应用
DOI：
10.1143/jjap.36.3152
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发表时间：
1997
影响因子：
1.5
通讯作者：
K. Nakamura
中科院分区：
文献类型：
--
作者：
Yasuo Cho;Shigeyuki Atsumi;K. Nakamura
研制了一种用于扫描非线性介质显微镜的集总常数谐振器探头。该探头具有足够的分辨率，可以观察铁电极化的面积分布。使用这种探针，在偏二氟乙烯和三氟乙烯的共聚物的薄膜和在锂的钛酸盐基板与钛扩散的反型层中的域的分布进行了观察。
A new probe using a lumped constant resonator for the scanning nonlinear dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polarization. Using this probe, the distributions of the domains in the thin film of a copolymer of vinylidene fluoride and trifluoroethylene and in a lithium niobate substrate with a titanium-diffused inversion layer are observed.