Molecular resolution electron micrographs of monolamellar paraffin crystals.
Molecular resolution electron micrographs of monolamellar paraffin crystals.
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DOI：
10.1126/science.4012326
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发表时间：
1985-08
期刊：
影响因子：
56.9
通讯作者：
F. Zemlin;E. Reuber;E. Beckmann;E. Zeitler;D. Dorset
中科院分区：
文献类型：
--
作者：
F. Zemlin;E. Reuber;E. Beckmann;E. Zeitler;D. Dorset
一个液态氦冷却的冷冻电子显微镜，操作暴露的标本只有一个非常低的电子剂量，被用来获得结构图像的单层n-十四烷（n-C44 H90）晶体在0.25纳米分辨率。这些结果与早期的预测相反，早期的预测认为，这种极其敏感的材料不能直接在这种细节水平上进行研究。对所得晶格图像的分析给出了晶体弯曲的直接证据，以及这种材料中刃位错的直接可视化。
A liquid helium-cooled cryoelectron microscope, operated to expose the specimen to only a very low electron dose, was used to obtain structural images of monolamellar n-tetratetracontane (n-C44H90) crystals at 0.25-nanometer resolution. These results are in contrast to earlier predictions that such extremely beam-sensitive materials could not be studied directly at this level of detail. Analysis of the resultant lattice images gives direct evidence for crystal bending as well as direct visualization of edge dislocations in this material.