BIST based fault diagnosis using ambiguous test set
BIST based fault diagnosis using ambiguous test set
复制标题
使用模糊测试集进行基于 BIST 的故障诊断
DOI：
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
Y. Takamatsu
中科院分区：
文献类型：
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作者：
Hiroshi Takahashi;Yasunori Tsugaoka;H. Ayano;Y. Takamatsu
我们提出了一种在内建自测试(BIST)环境下诊断单个固定故障的方法。在BIST环境下，由于测试响应高度紧凑，很难确定哪些BIST向量产生了错误。因此，在BIST会话中确定的检测测试集包括非检测测试。我们将BIST会话后确定的检测测试集称为“模糊诊断测试集”。首先，提出了一种基于模糊诊断测试集的候选故障识别方法。此外，我们还提出了一种识别属于模糊诊断测试集的候选非检测测试的方法。使用更准确的诊断测试集进行诊断可以改善诊断的模糊性。
We propose a method for diagnosing single stuck-at faults under a built-in self-test (BIST) environment. Under the BIST environment, it is difficult to determine which BIST vectors produced errors due to the high degree of test response compaction. Therefore the detecting test set that is determined in BIST session includes non-detecting tests. We call the detecting test set determined after BIST session an "ambiguous diagnostic test set". Firstly, we propose a method for identifying candidate faults based on the ambiguous diagnostic test set. Moreover we propose a method for identifying candidate non-detecting tests that belong to the ambiguous diagnostic test set. Diagnosis by using more accurate diagnostic test sets is able to improve the diagnostic ambiguity.