Novel Algorithm for Sample Material Parameter Determination using THz Time-Domain Spectrometer Signal Processing
Novel Algorithm for Sample Material Parameter Determination using THz Time-Domain Spectrometer Signal Processing
复制标题
使用太赫兹时域光谱仪信号处理确定样品材料参数的新算法
DOI：
10.1088/1742-6596/486/1/012018
复制
发表时间：
2014
期刊：
影响因子：
--
通讯作者：
S. Yurchenko
中科院分区：
文献类型：
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作者：
K. Zaytsev;A. Gavdush;S. Lebedev;S. Yurchenko
在我们的研究中，我们开发了一种新型的样本材料参数确定算法，可用于表征非常薄的平板。利用该算法，可以找到足够薄的介质的光学特性，以导致通过平面样本传输的TDS系统信号中出现卫星脉冲。该算法基于误差函数的最小化（样品传递函数的理论模型与THz脉冲光谱仪采集的实验数据之间的最小化）。该算法通过实验实现，并通过测试样本表征进行测试。算法实现的结果与使用太赫兹返波振荡器光谱学研究相同的测试样品的结果进行了比较。
In our research we have developed a novel sample material parameter determination algorithm which could be used for characterization of very thin flats. Utilizing this algorithm one could find optical properties of the media which are thin enough to cause appearance of the satellite pulses in TDS system signal, transmitted through the flat sample. The algorithm is based on the minimization of the Error function (minimization between the theoretical model of sample transfer function and the experimental data collected with THz pulsed spectrometer). The algorithm was implemented experimentally and tested by means of the test samples characterization. The results of the algorithm implementation were compared with the results of the same test sample studying using terahertz backward-wave oscillator spectroscopy.