Nanobeam X-Ray Scattering: Probing Matter at the Nanoscale
Nanobeam X-Ray Scattering: Probing Matter at the Nanoscale
复制标题
纳米束 X 射线散射：在纳米尺度探测物质
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
D. Carbone
中科院分区：
文献类型：
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作者：
J. Stangl;C. Mocuta;V. Chamard;D. Carbone
介绍X射线衍射原理-介绍-光束相干性-不同来源的特性：实验室VS同步加速器VS自由电子激光聚焦X射线-光束传输和建模-可用于硬X射线系统的聚焦原理-传统的微聚焦装置-使用纳米棒的实际问题散射实验-从系综平均方法到单一纳米结构的研究-单一纳米结构的衍射扫描X射线衍射显微镜-其他类型的对比-有机样品的局部X射线探针实验-生物样品的局部X射线探针实验纳米束衍射装置-纳米尺度上的光束定位-稳定性问题：在扫描角度期间保持样品上的斑点，振动-保持样品上光束位置恒定的有源系统-不同设置的限制-检测器问题：实空间和倒易空间的分辨率、动态范围、使用聚焦光束的时间分辨率光谱技术-Micro/Nano-EXAFS、XANES。荧光-软X射线应用一瞥-相干衍射-更多关于聚焦X射线光束的相干特性-使用相位恢复而不是建模方法-不同的恢复算法-单一结构的形状确定(恢复电子密度的模数)-应变确定(恢复电子密度的相位)-菲涅尔相干衍射成像-全息方法(使用参考波而不是数值相位恢复)-光刻(用于具有纳米结构的扩展对象)-在布拉格情况下使用相干衍射成像时的特殊优势和问题-方法的潜力和限制-限制束流大小--强度/亮度的极限--实空间和倒易空间的分辨率极限--与其他局部探测技术的结合--未来的发展--探测器的发展--第三代同步加速器源的光束线--自由电子激光的作用
INTRODUCTION X-RAY DIFFRACTION PRINCIPLES -Introduction -Beam Coherence -Specific Properties of Different Sources: Laboratory vs Synchrotron vs FEL FOCUSING OF X-RAYS -Beam Propagation and Modeling -Focusing Principles Available for the Hard X-Ray Regime -Clasic Microfocusing Devices -Practical Issues SCATTERING EXPERIMENTS USING NANOBEAMS -From the Ensemble Average Approach Towards the Single Nanostructure Study -Diffraction from Single Nanostructures -Scanning X-Ray Diffraction Microscopy -Other Types of Contrast -Local X-Ray Probe Experiments from Organic Samples -Local X-Ray Probe Experiments from Biological Samples NANOBEAM DIFFRACTION SETUPS -Beam Positioning on the Nanoscale -Stability Issues: Maintaining the Spot on the Sample During Scanning Angles, Vibrations -Active Systems to Maintain the Beam Position on the Sample Constant -Restriction of Different Setups -Detector Issues: Resolution in Real and Reciprocal Space, Dynamic Range, Time Resolution SPECTROSCOPIC TECHNIQUES USING FOCUSED BEAMS -Micro/Nano-EXAFS, XANES. Fluorescence -A Side Glance on Soft X-Ray Applications COHERENT DIFFRACTION -More on Coherence Properties of Focused X-Ray Beams -The Use of Phase Retrieval Instead of Modeling Approaches -Different Retrieval Algorithms -Shape Determination of Single Structures (Retrieving the Modulus of Electron Density) -Strain Determination (Retrieving the Phase of Electron Density) -Fresnel Coherent Diffractive Imaging -Holographic Approaches (Using a Reference Wave Instead of Numerical Phase Retrieval) -Ptychography (For Extended Objects with Nanoscale Structure) -Particular Advantages and Problems when Using Coherent Diffraction Imaging in the Bragg Case THE POTENTIAL AND THE LIMITS OF THE METHOD -Limits in Beam Size -Limits in Intensity/Brilliance -Resolution Limits in Real and Reciprocal Space -Combinations with Other Local Probe Techniques FUTURE DEVELOPMENTS -Detector Developments -Beamlines at Third Generation Synchrotron Sources -The Role of Free Electron Lasers