Rapid Broadband Discrete Nanomechanical Mapping on Atomic Force Microscope
Rapid Broadband Discrete Nanomechanical Mapping on Atomic Force Microscope
复制标题
原子力显微镜上的快速宽带离散纳米力学绘图
DOI：
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发表时间：
2019
期刊：
影响因子：
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通讯作者：
C. Su
中科院分区：
文献类型：
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作者：
Jingren Wang;Q. Zou;C. Su
本文提出了一种利用原子力显微镜对软样品进行宽带离散纳米力学映射的方法。需要纳米力学映射来研究动态演变的纳米力学性能的空间分布-前提是映射足够快。为了提高映射效率，我们建议通过仅在感兴趣的位置实施该技术来显着减少测量的数量，这进一步使得对经历动态过程的软样品的宽带纳米力学性质研究成为可能。首先，提出了一种基于在线搜索学习的优化方案，以实现快速的探针接合和撤回，在每个样品位置的最小探针-样品相互作用力。然后，一个基于分解的学习方法被用来实现样本位置之间的快速探针过渡。所提出的技术证明，通过多个位置上的聚二甲基硅氧烷（PDMS）样品在AFM实验的粘弹性测量。
In this paper, an approach for rapid broadband discrete nanomechanical mapping of soft samples using atomic force microscope is proposed. Nanomechanical mapping is needed to investigate, the spatial distribution of nanomechanical properties with dynamic evolution—provided that the mapping is fast enough. To enhance the mapping efficiency, we propose to significantly reduce the number of measurements by only implementing the technique at locations of interest, which further enables the broadband nanomechanical property study of soft samples undergoing dynamic processes. Firstly, an online searching learning-based optimization scheme is proposed to achieve the rapid probe engagement and withdrawal with minimum probe-sample interaction forces at each sample location. Then, a decomposition-based learning approach is used to achieve the rapid probe transition between sample locations. The proposed technique is demonstrated through multiple-location viscoelasticity measurements on a Polydimethylsiloxane (PDMS) sample in AFM experiment.