Effects of focused ion beam milling and pre-straining on the microstructure of directionally solidified molybdenum pillars: A Laue diffraction analysis
Effects of focused ion beam milling and pre-straining on the microstructure of directionally solidified molybdenum pillars: A Laue diffraction analysis
复制标题
聚焦离子束铣削和预应变对定向凝固钼柱微观结构的影响：劳厄衍射分析
DOI：
10.1016/j.scriptamat.2010.02.013
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发表时间：
2010
影响因子：
6
通讯作者：
H. Swygenhoven
中科院分区：
文献类型：
--
作者：
J. Zimmermann;S. Petegem;H. Bei;D. Grolimund;E. George;H. Swygenhoven
采用白色光束劳厄显微衍射技术对定向凝固单晶钼柱进行了聚焦离子束（FIB）铣削和预应变处理。从生长的支柱劳厄衍射峰是非常尖锐的，没有表现出加宽，类似于那些从单晶Si晶片。在FIB研磨和预应变之后发生峰的显著加宽和条纹，指示这些处理在定向凝固的Mo柱的几乎完美的晶体结构中引起的损伤。
White beam Laue micro-diffraction was performed on directionally solidified, single-crystal Mo pillars in the as-grown state, after focused ion beam (FIB) milling and after pre-straining. The Laue diffraction peaks from the as-grown pillars are very sharp and show no broadening, similar to those from single-crystal Si wafers. Significant broadening and streaking of the peaks occurred after FIB milling and pre-straining, indicative of the damage these treatments induce in the nearly perfect crystal structure of the directionally solidified Mo pillars.