Line identification of boron and nitrogen emissions in extreme- and vacuum-ultraviolet wavelength ranges in the impurity powder dropping experiments of the Large Helical Device and its application to spectroscopic diagnostics
Line identification of boron and nitrogen emissions in extreme- and vacuum-ultraviolet wavelength ranges in the impurity powder dropping experiments of the Large Helical Device and its application to spectroscopic diagnostics
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大型螺旋装置杂质落粉实验中极紫外和真空紫外波长范围内硼和氮发射的线识别及其在光谱诊断中的应用
DOI：
10.1088/2058-6272/abfd88
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发表时间：
2021
影响因子：
1.7
通讯作者：
Morisaki Tomohiro
中科院分区：
文献类型：
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作者：
Oishi Tetsutarou;Ashikawa Naoko;Nespoli Federico;Masuzaki Suguru;Shoji Mamoru;Gilson Erik;Lunsford Robert;Morita Shigeru;Goto Motoshi;Kawamoto Yasuko;SUZUKI Chihiro;Sun Zhen;Nagy Alex;Gates David;Morisaki Tomohiro
在大型螺旋装置实验的第21次活动中安装了杂质粉末滴管（2019年10月至2月）。2020年）在国家聚变科学研究所和普林斯顿等离子体物理实验室的合作下，用于实时壁调节和边缘等离子体控制。为了评估杂质粉末的有效注入，应用光谱诊断来观察来自注入杂质的线发射。因此，分析了极紫外（EUV）和真空紫外（VUV）发射光谱，总结了注入B和BN粉末时可观察到的杂质线。从B和N离子释放的发射线被确定在5-300 nm的EUV波长范围内使用两个掠入射平场EUV光谱仪测量，并且在300-2400 nm的VUV波长范围内使用三个垂直入射20 cm VUV光谱仪测量。在B和BN粉末注射的放电中分别识别出BI-BV和NIII-NVII发射线。具有大强度并与其它谱线分离的有用的B和N发射谱线成功地鉴定如下：BI（1825.89，1826.40）混合型，BII 1362.46混合型，BIII（677.00，677.14，677.16）混料，BIV 60.31千克，BV 48.59千克，NIII（989.79，991.51，991.58）（混合），NIV 765.15，NV（209.27，209.31）（混合），NVI 1896.80和NVII 24.78。线识别先进的光谱诊断的应用程序进行了演示，如垂直剖面测量BV和NVII线使用空间分辨EUV光谱仪和离子温度测量的BII线使用垂直入射3 m真空紫外光谱仪。
An impurity powder dropper was installed in the 21st campaign of the Large Helical Device experiment (Oct. 2019–Feb. 2020) under a collaboration between the National Institute for Fusion Science and the Princeton Plasma Physics Laboratory for the purposes of real-time wall conditioning and edge plasma control. In order to assess the effective injection of the impurity powders, spectroscopic diagnostics were applied to observe line emission from the injected impurity. Therefore, extreme-ultraviolet (EUV) and vacuum-ultraviolet (VUV) emission spectra were analyzed to summarize observable impurity lines with B and BN powder injection. Emission lines released from B and N ions were identified in the EUV wavelength range of 5–300 Å measured using two grazing incidence flat-field EUV spectrometers and in the VUV wavelength range of 300–2400 Å measured using three normal incidence 20 cm VUV spectrometers. BI–BV and NIII–NVII emission lines were identified in the discharges with the B and BN powder injection, respectively. Useful B and N emission lines which have large intensities and are isolated from other lines were successfully identified as follows: BI (1825.89, 1826.40) Å (blended), BII 1362.46 Å, BIII (677.00, 677.14, 677.16) Å (blended), BIV 60.31 Å, BV 48.59 Å, NIII (989.79, 991.51, 991.58) Å (blended), NIV 765.15 Å, NV (209.27, 209.31) Å (blended), NVI 1896.80 Å, and NVII 24.78 Å. Applications of the line identifications to the advanced spectroscopic diagnostics were demonstrated, such as the vertical profile measurements for the BV and NVII lines using a space-resolved EUV spectrometer and the ion temperature measurement for the BII line using a normal incidence 3 m VUV spectrometer.