Cryogenic transmission electron microscopy for materials research
Cryogenic transmission electron microscopy for materials research
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DOI：
10.1557/mrs.2019.283
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发表时间：
2019-12-01
期刊：
影响因子：
5
通讯作者：
Carter, C. Barry
中科院分区：
文献类型：
--
作者：
McComb, David W.;Lengyel, Jeffrey;Carter, C. Barry
低温透射电子显微镜是在显微镜中冷却的样品上进行的简单的透射电子显微镜。样品的目标温度范围可能从略低于环境温度到小于4 K。通常，随着温度降低，成本增加，特别是在低于-77摄氏度时，需要液态He。我们有两个原因想要冷却这种材料-提高材料的稳定性或观察在较低温度下性能发生变化的材料。这两种类型的研究都有很长的历史。今天这个领域令人兴奋的原因是我们有一场完美的研究活动风暴--电子显微镜几乎稳定，漂移最小（我们可以纠正存在的漂移），我们可以从大体积中制备样本或建立它们，我们有球像差校正镜头和单色光束，我们有直接电子探测器相机，计算机变得足够强大，可以处理我们产生的所有数据。
Cryogenic transmission electron microscopy is simply transmission electron microscopy conducted on specimens that are cooled in the microscope. The target temperature of the specimen might range from just below ambient temperature to less than 4 K. In general, as the temperature decreases, cost increases, especially below -77 degrees C when liquid He is required. We have two reasons for wanting to cool the specimen-improving stability of the material or observing a material whose properties change at lower temperatures. Both types of study have a long history. The cause of excitement in this field today is that we have a perfect storm of research activity-electron microscopes are almost stable with minimal drift (we can correct what drift there is), we can prepare specimens from the bulk or build them up, we have spherical-aberration-corrected lenses and monochromated beams, we have direct-electron-detector cameras, and computers are becoming powerful enough to handle all the data we produce.