Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media
Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media
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热辅助记录介质磁性薄膜的原子层堆叠结构和居里温度评价
DOI：
10.1109/tmag.2013.2285286
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发表时间：
2014
影响因子：
2.1
通讯作者：
Shintaro Hinata and Migaku Takahashi
中科院分区：
文献类型：
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作者：
Shin Saito;Shintaro Hinata and Migaku Takahashi
热辅助记录系统是克服垂直磁记录硬盘发展三难困境的一个很有希望的候选人。本文介绍了我国媒体材料评价的研究现状。面内x射线衍射技术可以有效地评价CoPt合金薄膜（111）取向面心立方、c面取向六方封闭堆积（hcp）的原子层堆积结构及其中间层堆积缺陷结构。对co50pt50基薄膜的分析结果表明，使价电子数更接近9可以有效地减少层错。在实际应用中，用Rh（9族）取代Pt（10族）可以实现完美的hcp原子层堆叠。探针直径为1 Å的扫描透射电子显微镜高角环形暗场可以有效观察co基合金薄膜中超晶格衍射的成分调制原子层叠加。在实际应用中，对于在高衬底温度下溅射的Co80M20 （M: Ir, Pt）薄膜，可以直接观察到富M层和贫M层的不规则或交替层状结构。居里温度（TC）是热辅助介质的重要物理性质，要评价它，应重点研究导电电子自旋相关散射。用椭偏仪测量TC ~ 320℃拟合MnSb薄膜的介电光谱，分析了TC附近电阻率和散射时间的Drude项、温度依赖关系。
Thermally assisted recording system is a promising candidate to overcome the trilemma of perpendicular magnetic recording hard disk drive development. In this paper, we introduce our current research about evaluation for the media material. In-plane X-ray diffraction technique is effective to evaluate atomic layer stacking structure of (111)-oriented face-centered cubic, c-plane-oriented hexagonal closed packed (hcp), and their intermediate structure with stacking faults of CoPt alloy thin film. Analytical results of Co50Pt50-based thin film shows that changing the valence electron number closer to 9 can effectively reduce the stacking fault. In practical, perfect hcp atomic layer stacking can be achieved by substituting Pt (group 10) with Rh (group 9). High-angle annular dark field of scanning transmission electron microscopy with probe diameter of 1 Å can effectively observe composition modulated atomic layer stacking with the super-lattice diffraction in Co-based alloy films. In practical, for Co80M20 (M: Ir, Pt) thin film sputtered under high substrate temperature, the irregular or alternately layered structure of M rich and M poor layer can be observed directly. To evaluate Curie temperature (TC), which is an important physical property of thermally assisted media, conduction electron spin-dependent scattering should be the focus. Fitting dielectric spectra for MnSb thin film with TC ~ 320°C measured with the ellipsometry and analyzing the Drude's term, temperature dependence of resistivity and scattering time at around TC was confirmed.