Effect of electromigration on mechanical shock behavior in solder joints of surface mounted chip components

Effect of electromigration on mechanical shock behavior in solder joints of surface mounted chip components
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电迁移对表面贴装片式元件焊点机械冲击行为的影响

DOI:
10.7567/jjap.53.04eb02
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发表时间:
2014
期刊:
JJAP
影响因子:
--
通讯作者:
K. Wilke
K. Wilke
中科院分区:
--
文献类型:
--
作者:
Y. Kim;S. Nagao;T. Sugahara;K. Suganuma;M. Ueshima;H.-J. Albrecht;K. Wilke

文献摘要

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