In Situ Measurement of Energy Level Shifts and Recombination Rates in Subphthalocyanine/C60 Bilayer Solar Cells
In Situ Measurement of Energy Level Shifts and Recombination Rates in Subphthalocyanine/C60 Bilayer Solar Cells
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DOI：
10.1021/jp505297u
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发表时间：
2014-10-09
影响因子：
3.7
通讯作者：
Durrant, James R.
中科院分区：
文献类型：
--
作者：
Credgington, Dan;Liu, Shun-Wei;Durrant, James R.
了解内部界面的性质和影响对于理解纳米结构有机器件（如有机光致发光器件）的操作至关重要。在这里，我们使用瞬态光电分析，以量化原位的HOMO能级位移和界面复合率的变化，发生在热蒸发亚酞菁（SubPc）/C-60双层太阳能电池作为SubPc蒸发源是不同的。我们展示了这样的测量可以补充非原位光学和物理技术，以访问设备修改的功能影响，特别是相对于所产生的设备开路电压（V-OC）。我们能够解释SubPc沉积条件的细微变化如何导致界面能量学和复合动力学的显著改变，从而导致V-OC的显著变化。
Understanding the nature and impact of internal interfaces is critical to understanding the operation of nanostructured organic devices, such as organic photovoltaics. Here, we use transient optoelectronic analysis to quantify in situ the HOMO level shifts and changes in interfacial recombination rate that occur within thermally evaporated subphthalocyanine (SubPc)/C-60 bilayer solar cells as the SubPc evaporation source is varied. We show how such measurements can complemnet ex situ optical and physical techniques to access the functional impact of device modification, particularly with respect to the resulting device open-circuit voltage (V-OC). We are able to explain how subtle changes in SubPc deposition conditions lead to significant modification of interfacial energetics and recombination dynamics which in turn cause sustantial changes in V-OC.